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 FDB44N25 250V N-Channel MOSFET
September 2005
UniFET
FDB44N25
250V N-Channel MOSFET Features
* 44A, 250V, RDS(on) = 0.069 @VGS = 10 V * Low gate charge ( typical 47 nC) * Low Crss ( typical 60 pF) * Fast switching * 100% avalanche tested * Improved dv/dt capability
TM
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor correction.
D
D
G
G
S
S
Absolute Maximum Ratings
Symbol
VDSS ID IDM VGSS EAS IAR EAR dv/dt PD TJ, TSTG TL Drain-Source Voltage Drain Current Drain Current Gate-Source voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation (TC = 25C) - Derate above 25C
(Note 2) (Note 1) (Note 1) (Note 3)
Parameter
- Continuous (TC = 25C) - Continuous (TC = 100C) - Pulsed
(Note 1)
FDB44N25
250 44 26.4 176 30 2055 44 30.7 4.5 307 2.45 -55 to +150 300
Unit
V A A A V mJ A mJ V/ns W W/C C C
Operating and Storage Temperature Range Maximum Lead Temperature for Soldering Purpose, 1/8" from Case for 5 Seconds
Thermal Characteristics
Symbol
RJC RJA* RJA
Parameter
Thermal Resistance, Junction-to-Case Thermal Resistance, Junction-to-Ambient* Thermal Resistance, Junction-to-Ambient
Min.
----
Max.
0.41 40 62.5
Unit
C/W C/W C/W
* When mounted on the minimum pad size recommended (PCB Mount)
(c)2005 Fairchild Semiconductor Corporation
1
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FDB44N25 Rev A
FDB44N25 250V N-Channel MOSFET
Package Marking and Ordering Information
Device Marking
FDB44N25
Device
FDB44N25TM
Package
D2-PAK
Reel Size
330mm
Tape Width
24mm
Quantity
800
Electrical Characteristics
Symbol
Off Characteristics BVDSS BVDSS / TJ IDSS IGSSF IGSSR VGS(th) RDS(on) gFS Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd
TC = 25C unless otherwise noted
Parameter
Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage Current, Forward Gate-Body Leakage Current, Reverse
Conditions
VGS = 0V, ID = 250A ID = 250A, Referenced to 25C VDS = 250V, VGS = 0V VDS = 200V, TC = 125C VGS = 30V, VDS = 0V VGS = -30V, VDS = 0V VDS = VGS, ID = 250A VGS = 10V, ID = 22A VDS = 40V, ID = 22A VDS = 25V, VGS = 0V, f = 1.0MHz
(Note 4)
Min.
250 ------
Typ.
-0.25 -----
Max Units
--1 10 100 -100 V V/C A A nA nA
On Characteristics Gate Threshold Voltage Static Drain-Source On-Resistance Forward Transconductance 3.0 ---0.058 32 5.0 0.069 -V S
Dynamic Characteristics Input Capacitance Output Capacitance Reverse Transfer Capacitance ---2210 450 60 2870 585 90 pF pF pF
Switching Characteristics Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge VDS = 200V, ID = 44A VGS = 10V
(Note 4, 5) (Note 4, 5)
VDD = 125V, ID = 44A RG = 25
--------
55 400 85 115 47 18 24
120 810 180 240 61 ---
ns ns ns ns nC nC nC
Drain-Source Diode Characteristics and Maximum Ratings IS ISM VSD trr Qrr
NOTES: 1. Repetitive Rating: Pulse width limited by maximum junction temperature 2. L = 1.7mH, IAS = 44A, VDD = 50V, RG = 25, Starting TJ = 25C 3. ISD 44A, di/dt 200A/s, VDD BVDSS, Starting TJ = 25C 4. Pulse Test: Pulse width 300s, Duty Cycle 2% 5. Essentially Independent of Operating Temperature Typical Characteristics
Maximum Continuous Drain-Source Diode Forward Current Maximum Pulsed Drain-Source Diode Forward Current Drain-Source Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS = 0V, IS = 44A VGS = 0V, IS = 44A dIF/dt =100A/s
(Note 4)
------
---195 1.8
44 176 1.4 ---
A A V ns C
2 FDB44N25 Rev A
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FDB44N25 250V N-Channel MOSFET
Typical Performance Characteristics
Figure 1. On-Region Characteristics
VGS 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V Top :
Figure 2. Transfer Characteristics
10
2
10
2
ID, Drain Current [A]
10
1
ID, Drain Current [A]
150 C
10
1
o
25 C -55 C
Notes : 1. VDS = 40V 2. 250 s Pulse Test
o
o
Notes : 1. 250 s Pulse Test 2. TC = 25
10
-1
10
0
10
1
10
0
2
4
6
8
VDS, Drain-Source Voltage [V]
VGS, Gate-Source Voltage [V]
Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperatue
0.125
10
2
RDS(ON) [ ], Drain-Source On-Resistance
0.100
0.075
VGS = 10V
IDR, Reverse Drain Current [A]
10
1
0.050
150
25
VGS = 20V
0.025
Note : TJ = 25
Notes : 1. VGS = 0V 2. 250 s Pulse Test
0.000 0 25 50 75 100
125
150
10
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
ID, Drain Current [A]
VSD, Source-Drain voltage [V]
Figure 5. Capacitance Characteristics
12
6000
Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd
Figure 6. Gate Charge Characteristics
5000
VGS, Gate-Source Voltage [V]
10
VDS = 50V VDS = 125V VDS = 200V
8
Capacitances [pF]
4000
Coss Ciss
3000
6
2000
4
1000
Crss
Note ; 1. VGS = 0 V 2. f = 1 MHz
2
Note : ID = 44A
0 -1 10
0
10
0
10
1
0
10
20
30
40
VDS, Drain-Source Voltage [V]
QG, Total Gate Charge [nC]
3 FDB44N25 Rev A

10
0
10
12
1.6
1.8
50
60
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FDB44N25 250V N-Channel MOSFET
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation vs. Temperature
1.2
Figure 8. On-Resistance Variation vs. Temperature
3.0
BVDSS, (Normalized) Drain-Source Breakdown Voltage
1.1
RDS(ON), (Normalized) Drain-Source On-Resistance
2.5
2.0
1.0
1.5
1.0
0.9
0.5
0.8 -100
-50
0
50
100
o
150
200
0.0 -100
-50
0
50
100
o
TJ, Junction Temperature [ C]
TJ, Junction Temperature [ C]
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current vs. Case Temperature
50
10
3
10 s
10
2
ID, Drain Current [A]
10
1
ID, Drain Current [A]
100 s 1 ms 10 ms 100 ms DC
Operation in This Area is Limited by R DS(on)
40
30
10
0
20
Notes :
o o
10
-1
1. TC = 25 C 2. TJ = 150 C 3. Single Pulse
10
10
-2
10
0
10
1
10
2
0 25
50
75
100
125
Figure 11. Transient Thermal Response Curve
Z JC Thermal Response (t),
D = 0 .5
10
-1
0 .2 0 .1
10
-2
0 .0 2 0 .0 1 s in g le p u ls e
PDM t1 t2
10
-5 -3 -2 -1 0 1
10
-4
10
10
10
t 1 , S q u a re W a v e P u ls e D u r a tio n [s e c ]
4 FDB44N25 Rev A
0 .0 5
N o te s : 1 . Z J C t) = 0 .4 1 ( /W M a x . 2 . D u ty F a c to r, D = t 1 /t 2 3 . T J M - T C = P D M * Z J C t) (
10
10
VDS, Drain-Source Voltage [V]
TC, Case Temperature [ ]
Notes : 1. VGS = 0 V 2. ID = 250 A
Notes : 1. VGS = 10 V 2. ID = 22 A
150
200
150
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FDB44N25 250V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
50K 12V 200nF 300nF
Same Type as DUT VDS
VGS Qg 10V Qgs Qgd
VGS
DUT
3mA
Charge
Resistive Switching Test Circuit & Waveforms
VDS VGS RG
RL VDD
VDS
90%
10V
DUT
VGS
10%
td(on) t on
tr
td(off) t off
tf
Unclamped Inductive Switching Test Circuit & Waveforms
L VDS ID RG 10V
tp
BVDSS 1 EAS = ---- L IAS2 -------------------2 BVDSS - VDD BVDSS IAS VDD ID (t) VDD
tp
DUT
VDS (t) Time
5 FDB44N25 Rev A
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Preliminary
FDB44N25 250V N-Channel MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+ VDS _
I SD L Driver RG
Same Type as DUT
VDD
VGS
* dv/dt controlled by RG * ISD controlled by pulse period
VGS ( Driver )
Gate Pulse Width D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
I SD ( DUT ) IRM
di/dt
Body Diode Reverse Current
VDS ( DUT )
Body Diode Recovery dv/dt
VSD
VDD
Body Diode Forward Voltage Drop
6 FDB44N25 Rev A
www.fairchildsemi.com
FDB44N25 250V N-Channel MOSFET
Mechanical Dimensions
D2-PAK
7
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FDB44N25 Rev A
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
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DISCLAIMER
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SuperSOTTM-8 SyncFETTM TinyLogic(R) TINYOPTOTM TruTranslationTM UHCTM UltraFET(R) UniFETTM VCXTM WireTM
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component is any component of a life 1. Life support devices or systems are devices or support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, or to affect its safety or failure to perform when properly used in accordance with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Preliminary
First Production
No Identification Needed
Full Production
Obsolete
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. I16


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